For 25 years , STIL (Sciences et Techniques Industrielles de la Lumière) proposes its skills and its know-how in high-performance optical instrumentation.
Inventor of chromatic confocal imaging and world leader in the domain of chromatic confocal distance sensors, STIL has designed two families of point sensors (CCS) and a family of line-sensor (MPLS) based on this innovative concept.
These high-resolution non-contact sensors meet the requirements of the most demanding applications, from microtopography and microform to shape and texture analysis and from roughness measurement to reverse engineering, both in industrial environment for in-line inspection during production process and in research laboratories as high precision instruments. They can measure any type of sample (transparent or opaque, polished or rough) and any type of material (metal, glass, ceramic, semiconductor, plastic, fabric...) and do not require any sample preparation.
STIL manufactures and sells stand-alone chromatic confocal sensors as well as a turnkey high precision, multi-sensor 3D measuring system (MICROMESURE).